Nanowire Magnetic Force Sensors Fabricated by Focused-Electron-Beam-Induced Deposition
نویسندگان
چکیده
منابع مشابه
Focused electron beam induced deposition: A perspective
BACKGROUND Focused electron beam induced deposition (FEBID) is a direct-writing technique with nanometer resolution, which has received strongly increasing attention within the last decade. In FEBID a precursor previously adsorbed on a substrate surface is dissociated in the focus of an electron beam. After 20 years of continuous development FEBID has reached a stage at which this technique is ...
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متن کاملCorrection: Modelling focused electron beam induced deposition beyond Langmuir adsorption
[This corrects the article DOI: 10.3762/bjnano.8.214.].
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ژورنال
عنوان ژورنال: Physical Review Applied
سال: 2020
ISSN: 2331-7019
DOI: 10.1103/physrevapplied.13.044043